ECE Research Seminar Series
The ECE Department is honored to have Distinguished-Speaker Jovan Brankov to speak at the ECE Graduate Research Seminar. Brankov is an associate professor of electrical and computer engineering, associate professor of biomedical engineering and director of Advance X-ray Imaging Laboratory (AXIL) at Illinois Tech. He will speak on his research, "Analyer Based Phase-Contrast X-ray Mammography."
Abstract
Analyzer-based phase contrast X-ray imaging (ABI) permits visualization of soft-tissue structures (such as in mammography) that are not detectable by use of conventional X-ray methods, at reduced radiation dose to the patient. Therefore, it holds great potential for a wide range of human, small-animal, and microscopic bioimaging applications. ABI utilizes a semiconductor crystal, called an analyzer, to selectively measure the angular content of an X-ray beam after it passes through the object. The tiny beam deflections reveal extremely fine detail, allowing extraordinary image quality for mammography and other soft-tissue applications. The journal Academic Radiology has called this technique the “third wave” in imaging breakthroughs, following shadowgraph imaging and computed tomography (CT). ABI has been well documented to produce extraordinary images at synchrotron facilities, but compact ABI prototypes have required imaging times that are far longer than what is practical for a clinical use. In this talk we will discuss a breakthrough approach, including a number of innovative design concepts that, when combined, are expected to deliver whole-breast imaging at 100 μm resolution in 10 seconds.
Biography
Brankov has been awarded over $4 million in NIH grants as Principal Investigator (P.I.) or subcontract P.I., and have been a key investigator on many grants totaling over $14 million in past 10 years. He is author/co-author of 150 publications, two technical reports, two patents, and a book chapter on ABI imaging. He is currently serving as: associate editor for Transaction on Medical Imaging (IEEE), Medical Physics (AAPM) and Journal of Medical Imaging (SPIE), program committee member for IEEE International Symposium on Biomedical Imaging and SPIE Image Perception conferences, and member of Bioimaging and Signal Processing (BISP) Technical Committee of the IEEE Signal Processing Society. He also served as ad hoc reviewer for the NIH BMIT-A and B study sections. He is a member of SPIE, Sigma Xi and senior member of IEEE technical communities.
Note: This seminar is open to everyone at Illinois Tech. For more information regarding this seminar, please contact Mahesh Krishnamurthy in ECE, Illinois Tech Phone: 7-7232, Email: kmahesh@ece.iit.edu
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